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JETTA – Special Issue on Analog, Mixed-Signal and RF Testing
Guest Editors: M. Lubaszewski, A. Richardson, C.C. Su

CALL FOR SUBMISSIONS

Overview -- Author Information -- Guest Editors

Overview


Rapid growth in system integration is making analog, mixed-signal and RF testing issues increasingly important. Complex systems embed analog and mixed-signal components in order to interface digital processing or to accelerate processing in high-performance devices, and RF parts for inter-systems communication. Areas of application include computers and video technologies, data communications, instrumentation and measurement, environment and process control, automotive electronics, and many others. The success of these applications, as determined by their quality and reliability, requires the integration of comprehensive test methodologies and tools into design and test environments. The purpose of this special issue of JETTA is to bring together survey papers, tutorials, and research articles in a single issue of the Journal. It will contain papers on all aspects of analog, mixed-signal and RF testing. The topics of interest include, but are not limited to:
  • Fault modeling and simulation
  • Test stimuli generation
  • Output response analysis
  • Test and diagnosis methodologies
  • Test application and optimization
  • Signal measurement
  • Mixed-signal testing infrastructure
  • BIST and DFT
  • Communication systems testing
  • Converters testing
  • FPAAs testing
  • Embedded core testing
  • High-speed IO
  • Signal integrity
  • Noise testing
  • RF testing
  • Nanotechnology test
  • On-line test and Fault tolerance
  • Self-tuning, self-calibration, self-correction
Author Information
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Authors should submit previously unpublished papers to the manuscript submission website:

www.editorialmanager.com/jetta/

specifying the article type as "AMS&RFT."

Expanded versions of conference papers are also welcome. Please follow the author instructions available at: www.springer.com/10836 when submitting your paper. The final selections will be made through the journal's peer review process.

The schedule is as follows:

Paper submission deadline: September 10, 2006
Acceptance/revision/rejection notification: November 5, 2006
Final manuscript: December 17, 2006
Tentative publication date: June 2007

Guest Editors
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M. Lubaszewski
UFRGS Federal University
Av. Osvaldo Aranha 103
90035-190 Porto Alegre, Brazil
Tel.: +55 3316 3516
Fax: +55 3316 3293
E-mail: luba@ece.ufrgs.br
A. Richardson
Lancaster University
Bailrigg Lancaster,
UK-LA1 4YR Lancaster, UK
Tel.: +44 7887 748313
Fax: +44 1524 381707
E-mail: a.richardson@lancaster.ac.uk
C.C. Su
Dept. Electrical Engineering
National Central University
TW-320 Taiwan R.O.C
Tel.: +886 3 4264209
Fax: +886 3 4255830
E-mail: ccsu@cn.nctu.edu.tw

IEEE Computer Society– Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Scott DAVIDSON
Sun Microsystems
- USA
Tel. +1-650-786-7256
E-mail scott.davidson@eng.sun.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
iRoC Technologies - France
Tel. +33-4-381-20763
E-mail michael.nicolaidis@iroctech.com

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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